Konrad Krzysztof Szwedowicz
Original record- Institution
- Technische Universiteit Eindhoven
- Year
- 2006
- Country
- Netherlands
- MGP identifier
- 317778
Dissertation: 3D-deflectometry: Fast nanotopography measurement for the semiconductor industry
Advisors 2
- Antonius Gregorius TijhuisTechnische Universiteit Delft · 1987
- Herman C. W. BeijerinckTechnische Universiteit Eindhoven · 1975
Students 0
No students recorded in this snapshot.