Yu Bi
Original record- Institution
- Technische Universiteit Delft
- Year
- 2012
- Country
- Netherlands
- MGP identifier
- 308675
Dissertation: Sensitivity Modeling of On-chip Capacitances: Parasitics Extraction for Manufacturing Variability
Advisors 2
- Patrick M. DewildeStanford University · 1970
- Nick P. van der MeijsTechnische Universiteit Delft · 1992
Students 0
No students recorded in this snapshot.