Jinkyu Yu
Original record- Institution
- Korea Advanced Institute of Science and Technology (KAIST)
- Year
- 2023
- Country
- South Korea
- MGP identifier
- 300806
Dissertation: Defect Inspection in Semiconductor Images Using Statistical Methods and Neural Networks
Mathematics Subject Classification: 65—Numerical analysis
Advisor 1
- Chang-Ock LeeUniversity of Wisconsin-Madison · 1995
Students 0
No students recorded in this snapshot.